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记忆体测试设备 Eureka

记忆体测试设备 Eureka
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  • 产品名称:记忆体测试设备 Eureka
  • 产品型号:Eureka
  • 产品展商:台湾固纬
  • 产品文档:无相关文档
简单介绍
记忆体测试设备 EurekaEureka 对记忆模组进行快速的功能动态测试,并采用多个先进的检查模式来检测出短/断路**、单一颗粒**、记忆胞间的绝缘**、时序及杂讯问题引起的间歇性**…等
产品描述
Eureka 对记忆模组进行快速的功能动态测试,并采用多个先进的检查模式来检测出短/断路**、单一颗粒**、记忆胞间的绝缘**、时序及杂讯问题引起的间歇性**…等记忆体测试设备 Eureka
加装选购的漏电流测试转接模组后,即可进行半导体漏电流特性的测试,并能检出DRAM晶片的微小漏电流。
Eureka 具有内建的SPD(serial presence detect)烧录器可用来烧录及验证测试SPD内容,可在记忆体模组测试时随同进行。
Eureka加入了许多加强功能来提升测试的正确性,像晶片预热chip-heating,电源电压变动模拟voltage bouncing,循环(回路)测试loop test,
可调式时基adjustable timing parameters (selected),可调整式更新模式及周期alterable refresh mode and cycle,更新测试refresh test,
ICC电流测定,也有Address与RAS/CAS测试,不论有/无缓冲级的模组,Eureka都能支援同位与ECC 位元检查,
另外,Eureka也能配合CST*新的RoboFlex自动取置机 来进行全自动测试,其效能表现更是如虎添翼,此外,可额外选购加装的测试配备有Flash testing,
Cache testing,DRAM & SDRAM TSOP Chips testing
规格
 
DDR testing platform
Clock Frequency
200 Mhz & 266 Mhz selectable
Address Depth
4 Gigawords test capacity up to 16 row x 16 column
Data Width
Expandable up to 80 bits
Timing Range
-1 , 0 and 1 ns
Timing Resolution
1 ns
Vdd Range
0.1V to 2.7V with 0.1V step and 10%Bounce
Vih, Voref Range
0.1V to 2.7V with 0.1V step
Read Latency
2,3 clocks
Refresh Cycle
Auto/Self Refresh - 8祍/Row
Refresh Modes
Auto Refresh , Self Refresh
Leakage Test Option
+/- 1礎 to +/- 5mA
Test Features
Burst Mode, Programmable Data Mask, Data Strobe, and Clock Suspend Modes
Current Test
Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A
Burst Length
Programmable to 2,4,8
CAS Latency
Programmable read Latency From Column Address
Serial PD
256 Bytes programmable
Testing Support Options
DDR 184pin DIMM and 200pin SODIMM
SDRAM testing platform
Clock Frequency
133 mhz 100 mhz, 66mhz, 33mhz selectable
Address Depth
4 Gigawords test capacity up to 16 row x 16 column
Data Width
Expandable up to 160 bits
Timing Range
0ns to 20ns in 1ns resolution
Timing Resolution
in steps of 1ns resolution
Vcc Range
0.1V to 3.6V with 0.1V step and 10 %Bounce
Vih, Voref Range
0.1V to 3.6V with 0.1V step
Read Latency
1,2,3 clocks
Refresh Cycle
Auto/Self Refresh - 8祍/Row to 64祍/Row
Refresh Modes
RAS only, CAS before RAS, Self Refresh
Leakage Test Option
+/- 1礎 to +/- 5mA
Test Features
Burst Mode, Programmable Data Mask and Clock Suspend Modes
Current Test
Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A
Burst Length
Programmable to 1,2,4,8 or Full Page
CAS Latency
Programmable read Latency From Column Address
Serial PD
256 Bytes programmable
Testing Support Options
SDRAM 100p, 168p, 200p, 244p, 278p DIMM, 144p Sodimm, TSOP, SGRAM 144p and many more
General specifications
Power Requirements
90-130 VAC, 180-260 VAC at 50Hz or 60 Hz
Operating Temperature
-20 to 100 degree Fahrenheit
Humidity
20% to 80%, non condensing
Overcurrent Protection
2A; to prevent Vcc and Ground short problems
Host Computer Requirement (Not Included)
IBM PC or Compatible 386/486/Pentium with one ISA or EISA bus interface slot available for CST, Inc. proprietary interface card
Operating System Requirement (Not Included)
Standard Microsoft Window Windows 95/9

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