ARGUS大面积镀膜玻璃离线表面扫描光电检查
测量玻璃镀膜透光率反射率镀膜厚度颜色值差异面电阻值
产品简介
ARGUS大面积镀膜玻璃离线表面扫描光电检查设备,测量仪器已安在多滚轴平台上,快速扫描地检查透光率、反射率、镀膜厚度、颜色值差异和面电阻值。离线检查,可作来料、成品检查、半成品抽样检查。
产品详介
ARGUS³© 5.7大面积镀膜玻璃离线表面扫描光电检查设备,专门为大面积镀膜玻璃检查而设,可处理*大面积2200 x 2600mm 及*大厚度6mm,测量仪器已安在多滚轴平台上,手动平放上玻璃在平台上,可手动选择或自动按已电脑选定的检查点,*快以每两秒一个点续点光谱读数,而电阻则每4秒一个读数。
检测功能包括:透光率、反射率、镀膜厚度、颜色值差异和面电阻值。设备包含一或两个光谱仪CORONA PLUS、光学镜头,电阻四针探头。所有测量头横向移动,玻璃由滚轴转向带动向前,软件按要编制,可与其他软件互接吻,例如:TopFilm©。ARGUS扫描软件提供快速数据处理,快速分析,可靠性高,可直接用于计算镀膜厚度及叠层分析。直接输出至试算表如:EXCEL。
ARGUS软件输出:镀膜厚度、光谱曲线、分析结果曲线(可作调整)、面电阻值、分析结果。
其他功能:扫描路线设计(带预设标淮路线图),网络联线,预设分析标准曲线图。报告可作数据跟踪,符合ISO9000要求。
特性:
光谱设备:
1. 横阔度 - 约3900mm
2. 扫描的速度 - 每小时1800点
3. 决长范围 - 400-1680nm
4. 精度 - 波长< 0.05 nm
- 透射率< 0.1 % T
- 反射率< 0.1 % R
面电阻设备:
5. 扫描的速度 - 每小时900点
6. 测量电阻范围 - 10 mΩ - 100 Ω ohms
7. 准确度 - ±3 % absolute, ± 1 % relative
8. 灵敏度 - ≤ 1%
9. 位置准确度 - ± 5 mm absolute
10. 位置精度 - ± 1 mm
ARGUS³© 5.7 is a surface inspection system for measuring and displaying optical and electrical properties of large-surface areas of coated substrate. The system can determine the transmission, reflection, coating thickness, color values and the electrical resistance of the coating. The maximum sample size is 2200 x 2600 mm and the maximum thickness 6 mm.
The ARGUS³© 5.7 inspection system is equipped with an state-of-the-art spectrometer for analyzing the light transmitted and reflected by the sample and a Keithley source meter for measuring the resistance present on the four-point measuring head. All measuring heads are moved by the Traverse. The sample will be transported by the roller table. These components and tailormade software packages, like TopFilm© and ARGUS software enable the fast and reliable analysis of the electrical and optical properties of the coated glass substrates.
ARGUS³© 5.7 平面镀膜玻璃光电检测系统
主要功能是测
The maximum sample size is 2200 x 2600 mm and the maximum thickness is 6 mm
Optical measuring system: (光学测量规格)
- Up to 1800 points per second for optical measurement(measuring range from 400 to 1680nm)
- Up to 900 points per second for optical measurement (measuring range from 400 to 1680nm) and resistance measurement
- Measurement spot size approx. 10 mm
- Medium spectral pixel spacing 3.3 nm
- Wave length accuracy ±1 nm above the wavelength range - 透射 / 反射光谱值
- Photometric measuring range 0.2 - 100 %
- Reproducibility Y, L*, Δa*, Δb*: ± 0.1 %
- Complete spectral range: ± 0.5 %
- Color calculation Y, L*, a*, b* (CIELAB) - 颜色值
- Light sources A, B, C, D50, D55, D65, D85, D75, F2, G, P TL84,Xe
- Standard observation 2°; 10°
- Measurable coating thickness Coatings >50 nm with > 20 % transmission - 薄膜厚度
Resistance measurement: (阻力测量规格)
- Up to 900 points per second
- Measurement diameter approx. 10 mm
- Measuring range 10 mΩ - 5 kΩ resistance - 电阻值
- Peak radius 150 μm
- Load per needle 100 g
- Clearance between probe tips 1 mm
- Accuracy ± 3 % absolute ± 1 % relative
- Sensitivity ≤ 1 %
- Measuring current 1 mA, 10 mA, 100 mA or 500 mA
- Measurement counter Records the number of measurements (must be reset after being replaced)
- Stability X-Y movement of the sensor <20 μm when penetrating the substrate
- Position accuracy ± 5 mm
- Reproducibility ± 1 mm
Glass dimensions:
- Width - min.750 max.2200 mm
- Length - min. 750 max. 2600 mm
- Thickness - min.3 max.6 mm
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