荧光光谱仪 X-Ray XAN? 和XDAL系列

		X射线荧光法是高效的材料分析工具。它广泛应用于镀层厚度测量，同时也适于进行元素分析。 可以对几乎任意尺寸和状态的工件进行分析。粉末和糊状材料可以和固体或液体一样进行分析。		FISCHERSCOPE® X-Ray XAN® 和XDAL系列高性能X射线荧光光谱仪，使用了带珀耳帖冷却的高光谱分辨率的半导体探测器和用于材料和多镀层分析的WinFTM® V6软件。 如果与应用工具箱Gold Assay组合在一起，这些仪器系列也是FISCHERSCOPE® GOLDLINE ASSAY的一部分－－珠宝和贵金属领域快速、无损和**测量金含量的理想设备。 详细内容参见下面表格。

FISCHERSCOPE® X-RAY XAN® FISCHERSCOPE® X-RAY XDAL FISCHERSCOPE® X-RAY XDV®-SD 测量方向 从下到上 从上到下 从上到下 X射线管为微聚焦管，带铍窗口 高压可调：10kV；30kV；50 kV 开槽测量室 准直器个数：4 Z轴 无 可编程 可编程 测试台类型 固定工作台 可编程XY工作台 可编程XY工作台 测试点放大倍数 34 －184倍 20 －180倍 20 －180倍 WinFTM® 版本 V6：基本型，带PDM WinFTM® Super可选 V6：基本型，带PDM WinFTM® Super可选 V6：基本型，带PDM WinFTM® Super可选 操作系统：Windows® XP专业版 Amount of primary filters 2 2 6 Digital pulse processor optional   standard

 FISCHERSCOPE^® X-RAY XDAL 是一款适用于大批量材料分析的X-射线光谱仪。

由于可检测元素范围宽至从铝到铀，使得FISCHERSCOPE^® X-RAY XDAL 的应用范围延伸至从工业到科学领域。无论分析应用于冶金上的，地质上的，石化上的还是其它种类的材料，FISCHERSCOPE^® X-RAY XDAL 都是一款强有力的和经济的光谱仪。

内置的彩色视频头使得X-射线光束快速和**地定位于被测工件上需要分析的范围。该仪器所提供的性能和特征的集合是在同样价格范围内的材料分析仪中无法找寻到的。

大测量箱，可编程的X-Y工作台，X-射线从上往下的设计，X-射线发生管和接受器装配系统的Z-轴运行使得设备非常适合于几个被测物体的编程测量和扫描较大工件。

独特的WinFTM^® V6 i软件是该仪器的核心。它可以分析多达24种元素的材料，无须校验标准块，带预估测量精度，以及测量非常复杂的镀层系统。

Are your products RoHS-compliant? Are you receiving the amount of gold that you paid for? Is your electroplating process cost-effective and yet still reliable? If you are unsure on any of these questions, then the FISCHERSCOPE® X-RAY XDV®-SD is your right choice! This instrument was especially developed for the challenging tasks of RoHS/ WEEE analyses. Furthermore, it is ideally suited for measurements of gold and other precious metals with a repeatability of gold analyses of up to 0,5 �. For coatings: Not only their consistence can be measured, but also their thickness! The FISCHERSCOPE® X-RAY XDV®-SD is a really versatile alround-talent!     RoHS / WEEE Very reliable measurement of Pb, Hg, Cd, Br and Cr. The achievable detection limits are 2 ppm for Pb, and 10 ppm for Cd in plastics material. The RoHS / WEEE limit values of 1000 ppm (Pb) and 100 ppm (Cd) can be verified reliably. Plastic samples can be analyzed correctly regardless of their thickness. Even small electronic components or coating systems on printed conductors are analyzed with pin-point precision. The XY(Z) stage allows for automatic scanning of pc-boards, for example.     The Software WinFTM® V.6 BASIC Up to 24 individual characteristic values of a sample with regard to coating thickness and element concentration can be determined simultaneously during one measurement. Very thin coatings down into the 10-nanometer range can be measured. Most often, complex multi-coating systems can be analyzed standard-free (without calibration) with great accuracy. The measurement accuracy can be raised to a maximum by using up to 64 calibration standards per application. This also ensures the traceability of the measurement results. DKD calibration certificates according to DIN EN ISO/IEC 17025 can be issued for many X-RAY calibration standards. The WinFTM® V.6 software enables very accurate results for materials analysis over a concentration range from a few ppm to 100 %.